TY  - GEN
AU  - Lau, June
AU  - Bonevich, John
AU  - Herzing, Andrew
AU  - Chiaramonti, Ann
AU  - Keller, Robert
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-12-21
DO  - https://doi.org/10.6028/NIST.SP.1217
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - A workshop report on “Electron Microscopy Frontiers: Challenges and Opportunities”
ER  -