TY  - JOUR
AU  - Killgore, Jason
AU  - Glover, Christopher
AU  - Tung, Ryan
C2  - Beilstein Journal of Nanotechnology
DA  - 2018-03-21
LA  - en
PB  - Beilstein Journal of Nanotechnology
PY  - 2018
TI  - AFM Scan Speed Phenomena
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923735
ER  -