TY  - CONF
AU  - Kopanski, Joseph
AU  - You, Lin
AU  - Obeng, Yaw
C2  - APS March Meeting 2018 Scientific Program, Los Angeles, CA
DA  - 2018-03-05
LA  - en
PB  - APS March Meeting 2018 Scientific Program, Los Angeles, CA
PY  - 2018
TI  - Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924700
ER  -