TY  - CONF
AU  - Pookpanratana, Sujitra
AU  - Lydecker, Leigh
AU  - Jang, Hyuk-Jae
AU  - Richter, Curt
AU  - Hacker, Christina
C2  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013, Gaithersburg, MD
DA  - 2013-03-27
LA  - en
PB  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013, Gaithersburg, MD
PY  - 2013
TI  - Metrology For Organic Monolayers On Cobalt Surfaces
ER  -