TY  - CONF
AU  - Ryan, Jason
AU  - Bittel, Brad
AU  - Lenahan, Pat
AU  - Fronheiser, Jody
AU  - Lelis, Aivars
C2  - Proceedings of the International Conference on Silicon Carbide and Related Materials, Cleveland, OH
DA  - 2013-01-01
LA  - en
PB  - Proceedings of the International Conference on Silicon Carbide and Related Materials, Cleveland, OH
PY  - 2013
TI  - Observation of Interface/Near Interface Defects in 4H SiC MOSFETs With a New Electrically Detected Magnetic Resonance Technique
ER  -