TY  - JOUR
AU  - Jargon, Jeffrey
AU  - Williams, Dylan
AU  - Sanders, Aric
C2  - IEEE Microwave and Wireless Components Letters
DA  - 2018-09-24
LA  - en
PB  - IEEE Microwave and Wireless Components Letters
PY  - 2018
TI  - The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured with a Two-Port Vector Network Analyzer
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925734
ER  -