TY  - JOUR
AU  - Woehl, Taylor
AU  - Keller, Robert
C2  - Ultramicroscopy
DA  - 2016-08-06
DO  - https://doi.org/10.1016/j.ultramic.2016.08.008
LA  - en
M1  - 171
PB  - Ultramicroscopy
PY  - 2016
TI  - Dark-Field Image Contrast in Transmission Scanning Electron Microscopy: Effects of Substrate Thickness and Detector Collection Angle
ER  -