TY  - JOUR
AU  - Whiting, Justin
AU  - Tondare, Vipin
AU  - Scott, John
AU  - Phan, Thien
AU  - Donmez
, M
C2  - CIRP Annals-ManufacturingTechnology
DA  - 2019-05-14
DO  - https://doi.org/10.1016/j.cirp.2019.04.075
LA  - en
M1  - 68
PB  - CIRP Annals-ManufacturingTechnology
PY  - 2019
TI  - Uncertainty of particle size measurements using dynamic image analysis
ER  -