TY  - JOUR
AU  - Black, David
AU  - Zhang, Ning
AU  - Dudley, M
AU  - Huang, X
AU  - Chen, Y
C2  - Journal of Electronic Materials
DA  - 2008-09-01
LA  - en
PB  - Journal of Electronic Materials
PY  - 2008
TI  - Studies of the Distribution of Elementary Threading Screw Dislocations In 4H Silicon Carbide Wafer
ER  -