TY  - GEN
AU  - Fiumara, Gregory
AU  - Flanagan, Patricia
AU  - Grantham, John
AU  - Ko, Kenneth
AU  - Marshall, Karen
AU  - Schwarz, Matthew
AU  - Tabassi, Elham
AU  - Woodgate, Bryan
AU  - Boehnen, Christopher
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-12-11
DO  - https://doi.org/10.6028/NIST.TN.2007
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - NIST Special Database 302: Nail to Nail Fingerprint Challenge
ER  -