TY  - GEN
AU  - Shi, Shendong
AU  - Muralikrishnan, Balasubramanian
AU  - Lee, Vincent
AU  - Sawyer, Daniel
AU  - Icasio-Hern?ndez, Octavio
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-05-28
DO  - https://doi.org/10.6028/jres.125.017
LA  - en
M1  - 125
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Improvised Long Test Lengths via Stitching Scale Bar Method: Performance Evaluation of Terrestrial Laser Scanners per ASTM E3125-17
ER  -