TY  - JOUR
AU  - Rigosi, Albert
AU  - Kruskopf, Mattias
AU  - Panna, Alireza
AU  - Payagala, Shamith
AU  - Jarrett, Dean
AU  - Newell, David
AU  - Elmquist, Randolph
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2020-08-31
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2020
TI  - Metrological Suitability of Functionalized Epitaxial Graphene
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929416
ER  -