TY  - CONF
AU  - Kopanski, Joseph
AU  - Afridi, Muhammad
AU  - Jiang, Chong
AU  - Lorek, Michael
AU  - Kohler, Timothy
AU  - Richter, Curt
C2  - 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
DA  - 2013-03-25
LA  - en
PB  - 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
PY  - 2013
TI  - Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes
ER  -