TY  - GEN
AU  - Jargon, Jeffrey
AU  - Williams, Dylan
AU  - Stelson, Angela
AU  - Long, Christian
AU  - Hagerstrom, Aaron
AU  - Hale, Paul
AU  - Stoup, John
AU  - Stanfield, Eric
AU  - Ren, Wei
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-08-10
DO  - https://doi.org/10.6028/NIST.TN.2109
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters
ER  -