TY  - CONF
AU  - Pratt, Kenneth
AU  - Duewer, David
C2  - 2009 NCSL International Workshop and Symposium, San Antonio, TX
DA  - 2009-07-30
LA  - en
PB  - 2009 NCSL International Workshop and Symposium, San Antonio, TX
PY  - 2009
TI  - Key Comparisons in Electrochemistry: Significance to Metrology and Global Trade
ER  -