TY  - CONF
AU  - Okoro, Chukwudi
AU  - Obeng, Yaw
AU  - Obrzut, Jan
AU  - Kabos, Pavel
AU  - Hummler, Klaus
C2  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV
DA  - 2013-05-28
LA  - en
PB  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV
PY  - 2013
TI  - Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
ER  -