TY  - JOUR
AU  - Anders, Mark
AU  - Lenahan, Patrick
AU  - Ryan, Jason
C2  - Materials Science Forum
DA  - 2020-07-01
DO  - https://dx.doi.org/10.1002/DOI: 10.4028/www.scientific.net/MSF.1004.573
LA  - en
M1  - 1004
PB  - Materials Science Forum
PY  - 2020
TI  - Wafer-Level near Zero Field Spin Dependent Charge Pumping: Effects of Nitrogen on 4H-SiC MOSFETs
UR  - DOI: 10.4028/www.scientific.net/MSF.1004.573
ER  -