TY  - JOUR
AU  - Anders, Mark
AU  - Lenahan, Patrick
AU  - Harmon, Nicholas
AU  - Flatte, Michael
C2  - Journal of Applied Physics
DA  - 2020-12-28
DO  - https://dx.doi.org/10.1063/5.0027214
LA  - en
M1  - 128
PB  - Journal of Applied Physics
PY  - 2020
TI  - A technique to measure spin-dependent trapping events at the metal-oxide-semiconductor field-effect transistor interface: Near zero field spin-dependent charge pumping
ER  -