TY  - GEN
AU  - Sawyer, Daniel
AU  - Parry, Brian
AU  - Blackburn, Christopher
AU  - Muralikrishnan, Balasubramanian
AU  - Phillips, Steven
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-09-27
DO  - https://doi.org/10.6028/jres.117.013
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - A Model for Geometry-Dependent Errors in Length Artifacts
ER  -