TY  - GEN
AU  - Lee, Yooyoung
AU  - Filliben, James
AU  - Micheals, Ross
AU  - Phillips, P
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-05-17
DO  - https://doi.org/10.6028/NIST.IR.7855
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - Sensitivity Analysis for Biometric Systems: A Methodology Based on Orthogonal Experiment Designs
ER  -