TY  - CONF
AU  - Dixson, Ronald
AU  - Boon, 
AU  - McGray, Craig
AU  - Orji, Ndubuisi
AU  - Geist, Jon
C2  - Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, Baltimore, MD
DA  - 2011-05-10
LA  - en
M1  - 8378
PB  - Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, Baltimore, MD
PY  - 2011
TI  - Progress on CD-AFM tip width calibration standards
ER  -