TY  - JOUR
AU  - Postek, Michael
AU  - Vladar, Andras
AU  - Ming, Bin
C2  - Microscopy Today
DA  - 2009-03-01
LA  - en
PB  - Microscopy Today
PY  - 2009
TI  - On the Sub-Nanometer Resolution of Scanning Electron and Scanning Helium Ion Microscopes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901569
ER  -