TY  - GEN
AU  - Gates, Richard
AU  - Reitsma, Mark
AU  - Kramar, John
AU  - Pratt, Jon
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2011-07-01
DO  - https://doi.org/10.6028/jres.116.015
LA  - en
M1  - 116
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2011
TI  - Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method
ER  -