TY  - JOUR
AU  - Ryan, Jason
AU  - Southwick, Richard
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
C2  - IEEE Transactions on Electron Devices
DA  - 2012-10-01
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2012
TI  - On the Contribution of Bulk Defects on Charge Pumping Current
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911823
ER  -