TY  - CONF
AU  - Woodward, John
AU  - Hwang, Jeeseong
AU  - Prabhu, V
C2  - 2007 Int. Conference, on the Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
DA  - 2007-01-01
LA  - en
PB  - 2007 Int. Conference, on the Frontiers of Characterization and Metrology for Nanoelectronics , Gaithersburg, MD
PY  - 2007
TI  - Hunting the Origins of Line Width Roughness with Chemical Force Microscopy
ER  -