TY  - JOUR
AU  - Tedesco, Joseph
AU  - Zheng, Walter
AU  - Kirillov, Oleg
AU  - Pookpanratana, Sujitra
AU  - Jang, Hyuk-Jae
AU  - Kavuri, Premsagar
AU  - Nguyen, Nhan
AU  - Richter, Curt
C2  - Proceedings of the IEEE
DA  - 2011-12-07
LA  - en
PB  - Proceedings of the IEEE
PY  - 2011
TI  - Characterization and Resistive Switching Properties of Solution-Processed HfO2, HfSiO4, and ZrSiO4 Thin Films on Rigid and Flexible Substrates
ER  -