TY  - CONF
AU  - Ryan, Jason
AU  - Wei, Lan
AU  - Campbell, Jason
AU  - Southwick, Richard
AU  - Cheung, Kin
AU  - Oates, Tony
AU  - Wong, Phillip
AU  - Suehle, John
C2  - International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA
DA  - 2011-12-15
LA  - en
PB  - International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA
PY  - 2011
TI  - When Does a Circuit Really Fail?
ER  -