TY  - CONF
AU  - Kraft, Marlin
AU  - van, Jan
AU  - Rietveld, Gert
C2  - CPEM 2012 Conference Digest
, National Harbor, MD
DA  - 2012-09-01
LA  - en
PB  - CPEM 2012 Conference Digest
, National Harbor, MD
PY  - 2012
TI  - Evaluation of Low-Ohmic Resistance Measurement Capabilities Between VSL and NIST
ER  -