TY  - CONF
AU  - Kopanski, Joseph
AU  - Sitnitsky, Ilona
AU  - Vartanian, Victor
AU  - McClure, Paul
AU  - Mancevski, Vladimir
C2  - AIP Conference Proceedings: 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1
DA  - 2011-11-18
LA  - en
M1  - 1395
PB  - AIP Conference Proceedings: 2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Grenoble, -1
PY  - 2011
TI  - Enhanced Spatial Resolution Electrical Scanning Probe Microscopy By Using Carbon Nanotube Terminated Tips
ER  -