TY  - CONF
AU  - Geiss, Roy
AU  - Keller, Robert
AU  - Read, David
C2  - Microscopy and Microanalysis 2010 Proceedings, Portland, OR
DA  - 2010-01-01
LA  - en
PB  - Microscopy and Microanalysis 2010 Proceedings, Portland, OR
PY  - 2010
TI  - Transmission Electron Diffraction from nanoparticles, nanowires and thin films in an SEM using conventional EBSD equipment
ER  -