TY  - GEN
AU  - Afridi, Muhammad
AU  - Montgomery, Christopher
AU  - Semancik, Stephen
AU  - Kreider, Kenneth
AU  - Geist, Jon
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-01-03
LA  - en
M1  - 116
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - MICROHOTPLATE TEMPERATURE SENSOR CALIBRATION AND BIST
ER  -