TY  - CONF
AU  - Ryan, Jason
AU  - Wei, Lan
AU  - Campbell, Jason
AU  - Southwick, Richard
AU  - Cheung, Kin
AU  - Oates, Anthony
AU  - Suehle, John
AU  - Wong, Phillip
C2  - Proceedings of the European Solid State Device Research Conference, Helsinki, -1
DA  - 2011-09-12
LA  - en
PB  - Proceedings of the European Solid State Device Research Conference, Helsinki, -1
PY  - 2011
TI  - Circuit-Aware Device Reliability Criteria Methodology
ER  -