TY  - JOUR
AU  - DelRio, Frank
AU  - Cook, Robert
AU  - Boyce, Brad
C2  - Applied Physics Reviews
DA  - 2015-05-13
DO  - https://doi.org/10.1063/1.4919540
LA  - en
PB  - Applied Physics Reviews
PY  - 2015
TI  - Fracture strength of micro- and nano-scale silicon components
ER  -