TY  - JOUR
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, A
C2  - IEEE Electron Device Letters
DA  - 2011-08-01
LA  - en
M1  - 32
PB  - IEEE Electron Device Letters
PY  - 2011
TI  - A Simple Series Resistance Extraction Methodology for Advanced CMOS Devices
ER  -