TY  - CONF
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Yu, Liangchun
AU  - Suehle, John
AU  - Sheng, Kuang
AU  - Oates, A
C2  - 2010 IEEE VLSI Symposium on Technology, Honolulu, HI
DA  - 2010-06-01
LA  - en
PB  - 2010 IEEE VLSI Symposium on Technology, Honolulu, HI
PY  - 2010
TI  - New Methods for the Direct Extraction of Mobility and Series Resistance from a Single Ultra-Scaled Device
ER  -