TY  - CHAP
AU  - Obrzut, Jan
AU  - Schumacher, Bernd
AU  - Heinz-Gunter, 
AU  - Spitzer, Petra
C2  - Springer Handbook Handbook of Metrology and Testing, Springer, Heidelberg, -1
DA  - 2011-08-01
LA  - en
PB  - Springer Handbook Handbook of Metrology and Testing, Springer, Heidelberg, -1
PY  - 2011
TI  - Springer Handbook of Metrology and Testing, Electrical Properties
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906744
ER  -