TY  - JOUR
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, A
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2010-12-01
LA  - en
M1  - 10
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2010
TI  - The Role of High-Field Stress in the Negative Bias Temperature Instability
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902186
ER  -