TY  - JOUR
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Yu, Liangchun
AU  - Suehle, John
AU  - Sheng, Kuang
AU  - Oates, A
C2  - IEEE Electron Device Letters
DA  - 2011-01-03
LA  - en
M1  - 32
PB  - IEEE Electron Device Letters
PY  - 2011
TI  - Geometric Magnetoresistance Mobility Extraction in Highly Scaled Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905955
ER  -