TY  - JOUR
AU  - Bertness, Kristine
AU  - Cossel, Kevin
AU  - Adler, F
AU  - Thorpe, M
AU  - Ye, Jun
C2  - Applied Physics B-Photophysics and Laser Chemistry
DA  - 2010-07-20
LA  - en
M1  - 10
PB  - Applied Physics B-Photophysics and Laser Chemistry
PY  - 2010
TI  - Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908253
ER  -