TY  - CONF
AU  - Vorburger, Theodore
AU  - Song, Jun-Feng
AU  - Chu, Wei
AU  - Thomas, 
AU  - Xiaoyu, 
AU  - Yen, James
AU  - Thompson, Robert
AU  - Richard, 
AU  - Bachrach, Benjamin
AU  - Ols, Martin
C2  - SPIE Scanning Microscopy, Monterey, CA
DA  - 2010-07-01 00:07:00
LA  - en
M1  - 7729
PB  - SPIE Scanning Microscopy, Monterey, CA
PY  - 2010
TI  - Topography measurements for correlations of standard cartridge cases
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905846
ER  -