TY  - GEN
AU  - Duewer, David
AU  - Parris, Reenie
AU  - White, Edward
AU  - May, Willie
AU  - Elbaum, H.
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2004-12-01
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2004
TI  - An Approach to the Metrologically Sound Traceable Assessment of the Chemical Purity of Organic Reference Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901295
ER  -