TY  - JOUR
AU  - Chung, Jun
AU  - Nolte, Adam
AU  - Stafford, Christopher
C2  - Advanced Materials
DA  - 2010-09-02
LA  - en
M1  - 23
PB  - Advanced Materials
PY  - 2010
TI  - Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902425
ER  -