TY  - GEN
AU  - Phillips, P
AU  - Flynn, Patrick
AU  - Beveridge, J.
AU  - Bowyer, Kevin
AU  - Scruggs, W
AU  - O'Toole, Alice
AU  - Bolme, David
AU  - Draper, Bruce
AU  - Givens, Geof
AU  - Lui, Yui
AU  - Sahibzada, Hassan
AU  - Scallan, Joseph
AU  - Weimer, Samuel
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2009-07-23
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2009
TI  - Overview of the Multiple Biometrics Grand Challenge
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903086
ER  -