TY  - CONF
AU  - Kopanski, Joseph
AU  - McClure, Paul
AU  - Mancevski, Vladimir
C2  - AIP Conference Proceedings, Frontiers of Characterization and Metrology for Nanoelectronics: 2009, Albany, NY
DA  - 2009-10-05
LA  - en
PB  - AIP Conference Proceedings, Frontiers of Characterization and Metrology for Nanoelectronics: 2009, Albany, NY
PY  - 2009
TI  - Enhanced Spatial Resolution Scanning Kelvin Force Microscopy Using Conductive Carbon Nanotube Tips
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903125
ER  -