TY  - CONF
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, A
C2  - International Conference on IC Design and Technology (ICICDT), Austin, TX
DA  - 2009-05-18
LA  - en
PB  - International Conference on IC Design and Technology (ICICDT), Austin, TX
PY  - 2009
TI  - The Negative Bias Temperature Instability vs. High-Field Stress Paradigm
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902213
ER  -