TY  - JOUR
AU  - Baker-Jarvis, James
AU  - Janezic, Michael
AU  - DeGroot, Donald
C2  - IEEE Instrumentation and Measurement Magazine
DA  - 2010-04-01
LA  - en
PB  - IEEE Instrumentation and Measurement Magazine
PY  - 2010
TI  - High-Frequency Dielectric Measurements: A Tutorial
ER  -