TY  - CONF
AU  - Kacker, Raghu
AU  - Kessel, Ruediger
AU  - Klaus-Dieter, 
AU  - Bian, Xin
C2  - XIX IMEKO World Congress 2009, Lisbon, -1
DA  - 2008-09-06
LA  - en
PB  - XIX IMEKO World Congress 2009, Lisbon, -1
PY  - 2008
TI  - Comparison of statistical consistency and metrological consistency
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902861
ER  -