TY  - GEN
AU  - Moylan, Shawn
AU  - Slotwinski, John
AU  - Cooke, A
AU  - Jurrens, Kevin
AU  - Donmez, M
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2014-10-23
DO  - https://doi.org/10.6028/jres.119.017
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2014
TI  - An Additive Manufacturing Test Artifact
ER  -