TY  - CONF
AU  - Jin, 
AU  - Martin, Alvin
AU  - Kacker, Raghu
AU  - Hagwood, Robert
C2  - SPIE Biometrics 2010, Orlando, FL
DA  - 2010-04-05
LA  - en
M1  - 7667
PB  - SPIE Biometrics 2010, Orlando, FL
PY  - 2010
TI  - Significance Test in Operational ROC Analysis
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903768
ER  -