TY  - CONF
AU  - Yu, Liangchun
AU  - Cheung, Kin
AU  - Campbell, Jason
AU  - Suehle, John
AU  - Sheng, Kuang
C2  - 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV
DA  - 2008-10-12
LA  - en
PB  - 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV
PY  - 2008
TI  - Oxide Reliability of SiC MOS Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=900182
ER  -